文章目录
- objectives
- Full DFT Flow in Tessent Shell
- Black Boxes
- Auto Black Boxing for Incomplete Netlists
- Black Box Examples
- ATPG Setup
- Test Procedure File
- Test Procedure File: Timeplates
- Test Procedure File: Setup, Load Unload
- Test Procedure File: Load_Unload and Shift
- Dofile
- Dofile: Scan Chain Definition
- Dofile: Clock/Control Signal Definition
- DC Scan Insertion Flow
- DC Scan Insertion
- ATPG Process
- ATPG Process: Setup
- ATPG Process: DRCs
- DRCs
- ATPG Process: Confiquring ATPG
- ATPG Process: Generate Patterns
- ATPG Process: Save Results
- **点击这里：E课网IC设计学习卡**
objectives
Upon completion of this module , you should be able to:
- List the basic steps of the ATPG flow — from inserting scan to test pattern generation.
- List the required inputs/outputs for the flow.
- Set up a design for test pattern generation.
- Describe the purpose of:
- ATPG models
- Test procedure files
- Dofiles
- Successfully take a simple design through the following process:
- Read in a scan-inserted netlist
- Generate test patterns
- Save test patterns
完成本模块后，您应该能够：
- 列出ATPG流程的基本步骤——从插入扫描到测试patterns的生成。【测试patterns的产生过程】
- 列出流程所需的输入/输出。
- 设置用于测试模式生成的设计。
- 描述以下各项的用途：
- ATPG模型
- 测试程序文件
- Dofiles
- 通过以下流程成功处理一个简单的设计：
- 读取插入扫描的网表
- 生成测试patterns
- 保存测试patterns
